基于LEED精细结构分析的表面屏障研究

P.J. Jennings, R.O. Jones
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引用次数: 0

摘要

综述了LEED精细结构分析在表面势能势垒研究中的应用。使用饱和图像屏障模型对W(001)和W(110)的数据进行分析,证明了该模型的充分性,并提供了屏障结构的进一步细节。计算模型和分析结果与最近的金属-真空界面理论进行了比较。目前的证据表明,凝胶计算提供了过渡金属表面上的屏障的定性正确的图像。LEED精细结构分析似乎也是进一步研究表面屏障的一种有前途的直接方法。
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Surface barrier studies with LEED fine structure analysis

The application of LEED fine structure analysis to the study of the surface potential energy barrier is reviewed. Analysis of data for W(001) and W(110) using a saturated image barrier model demonstrates the adequacy of the model and provides further details of the barrier structure. The computational model and the results of the analysis are compared with recent theories of the metal-vacuum interface. The present evidence suggests that jellium calculations provide a qualitatively correct picture of the barrier on transition metal surfaces. LEED fine structures analysis also appears to be a promising direct method for further studies of surface barriers.

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