循环HPT应变对一次应变稳态晶粒尺寸的影响

H. Sato, N. Adachi, Y. Todaka
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摘要

采用引入正、负剪切应变的重复变形过程,系统研究了一次应变|±Δε |对晶粒再细化的影响。稳态晶粒尺寸dss取决于|±Δε |,而不是给定的总应变Σ |±Δε |。正应变+ Δε形成的不稳定位错细胞壁被负应变- Δε破坏。随着在晶粒n中施加|±Δε |引起的位错数目的增加,位错细胞壁的稳定性增加。n的减少是由于+ Δε和晶粒尺寸的减小引起的。结果表明,n - a - ff影响位错细胞壁的稳定性,是决定位错细胞壁稳定性的重要因素。[doi:10.2320 / jinstmet.]J2020045]
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Effect of One-Pass Strain on Steady-State Grain Size by Cyclic - HPT Straining
The e ff ect of one – pass strain, | ± Δε |, on grain re fi nement was systematically investigated by cyclic – HPT straining with a repetitive deformation process in which positive and negative shear strain are introduced. The steady – state grain size, d ss , depended on | ± Δε | rather than the given total strain, Σ | ± Δε |. The unstable dislocation cell walls formed by positive strain, + Δε , was discomposed by negative strain, − Δε . The stability of dislocation cell wall increased as the number of dislocations introduced by applying | ± Δε | in a grain, n , increased. The decrease in n was caused by decreasing + Δε and grain size. It was found that n a ff ected the stability of dislocation cell walls and was an important factor in determining d ss . [ doi:10.2320 / jinstmet.J2020045 ]
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