小型激光等离子体硬x射线源的研制

T. Nayuki, Y. Oishi, T. Fujii, K. Nemoto, A. Zhidkov
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摘要

100 keV以上的硬x射线是金属结构无损诊断的重要工具。这些x射线可以由放射性同位素如192Ir或60Co产生,也可以从x射线管产生。然而,这些同位素需要严格控制才能安全处理,而且x射线管的尺寸太大,无法在现场测量。超强飞秒激光脉冲与物质的相互作用是由相对论性电子的轫致辐射和物质的特征线发射产生的硬x射线的来源。这种x射线源的主要缺点是极高的成本和高功率飞秒激光系统的大规模。在这项研究中,我们报道了一种104*82*75 mm3大小的x射线源的开发,该源由能量仅为20 mJ、持续时间仅为40 fs的激光脉冲驱动。直径12.7毫米的激光束由小型光学器件传送,并聚焦在由5毫米厚的铜制成的带靶上。高能部分的电子温度测量值为340 keV,与包括等离子体电离在内的二维粒子碰撞模拟结果一致。x射线源在激光焦点处的辐照尺寸采用刀口阴影法测量。使用这种紧凑的x射线源,用100次激光积累获得了10mm厚铝样品的透射图像。高能部分的x射线温度估计为35kev,与低能部分的电子温度一致。
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Development of a compact laser-plasma hard x-ray source
Hard X-ray over 100 keV is known to be an important tool for nondestructive diagnosis of metal structures. These X-rays can be generated from radioisotopes such as 192Ir or 60Co, or from an X-ray tube. However, these isotopes require a severe control for a safely handling and the dimension of the X-ray tube is too large to measure in situ. The interaction of an ultraintense femtosecond laser pulse with matter acts as a source of hard X-rays produced by bremsstrahlung of relativistic electrons and characteristic line emission from the matter. The main drawback of this kind of X-ray source is the extremely high cost and the large scale of high-power femtosecond laser systems. In this study, we report on the development of a 104*82*75 mm3-sized X-ray source, which is driven by laser pulses of only 20 mJ energy and 40 fs duration. The laser beam with 12.7 mm diameter is delivered by small optics and is focused onto a tape target made of copper 5 mum thick. A measured electron temperature of energetic part was 340 keV, which agreed with that of two-dimensional collisional particle-in-cell simulations including plasma ionization. The irradiation size of the X-ray source at the laser focus was 16 mum measured by means of a knife-edge shadowgraphy. Using this compact X-ray source, a transmission image of a sample made of aluminum 10 mm thick was obtained with 100-shot laser accumulations. An estimated X-ray temperature of energetic part was 35 keV, which agreed with the electron temperature of low energy part.
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