容缺陷电介质系统理论

IEEE Transactions on Electrical Insulation Pub Date : 1993-06-01 DOI:10.1109/14.236211

S. Boggs

{"title":"容缺陷电介质系统理论","authors":"S. Boggs","doi":"10.1109/14.236211","DOIUrl":null,"url":null,"abstract":"The properties of a dielectric for which the resistivity is an exponential function of electric field are examined. It is shown that such a dielectric exhibits a limiting electric field when applied to an AC system. The thermal characteristics of a small conducting stress enhancement in this system are examined to demonstrate thermal stability for power frequency applications. >","PeriodicalId":13105,"journal":{"name":"IEEE Transactions on Electrical Insulation","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1993-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":"{\"title\":\"Theory of a defect-tolerant dielectric system\",\"authors\":\"S. Boggs\",\"doi\":\"10.1109/14.236211\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The properties of a dielectric for which the resistivity is an exponential function of electric field are examined. It is shown that such a dielectric exhibits a limiting electric field when applied to an AC system. The thermal characteristics of a small conducting stress enhancement in this system are examined to demonstrate thermal stability for power frequency applications. >\",\"PeriodicalId\":13105,\"journal\":{\"name\":\"IEEE Transactions on Electrical Insulation\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"24\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Electrical Insulation\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/14.236211\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electrical Insulation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/14.236211","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 24

摘要

本文研究了电阻率为电场指数函数的电介质的性质。结果表明，当应用于交流系统时，这种电介质表现出限制电场。研究了该系统中一个小的传导应力增强的热特性，以证明其在工频应用中的热稳定性。>

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

Theory of a defect-tolerant dielectric system

The properties of a dielectric for which the resistivity is an exponential function of electric field are examined. It is shown that such a dielectric exhibits a limiting electric field when applied to an AC system. The thermal characteristics of a small conducting stress enhancement in this system are examined to demonstrate thermal stability for power frequency applications. >

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

IEEE Transactions on Electrical Insulation

自引率

0.00%

发文量