用于管道监测的线性LoRaWAN传感器网络体系结构的可靠性和可用性评估

{"title":"用于管道监测的线性LoRaWAN传感器网络体系结构的可靠性和可用性评估","authors":"T. Addabbo, A. Fort, Elia Landi, M. Mugnaini, E. Panzardi, A. Pozzebon, V. Vignoli","doi":"10.1109/I2MTC43012.2020.9128535","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":93508,"journal":{"name":"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference","volume":"31 1","pages":"1-6"},"PeriodicalIF":0.0000,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Reliability and Availability Evaluation of Linear LoRaWAN Sensor Network Architectures for Pipeline Monitoring\",\"authors\":\"T. Addabbo, A. Fort, Elia Landi, M. Mugnaini, E. Panzardi, A. Pozzebon, V. Vignoli\",\"doi\":\"10.1109/I2MTC43012.2020.9128535\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":93508,\"journal\":{\"name\":\"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference\",\"volume\":\"31 1\",\"pages\":\"1-6\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/I2MTC43012.2020.9128535\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/I2MTC43012.2020.9128535","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}