测量薄膜在局部放电时的耐久性

R. Bozzo, L. Centurioni, F. Guastavino
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引用次数: 33

摘要

介绍了一种新的测试装置,用于测试聚合物和陶瓷薄膜在局部放电作用下的耐久性。如果实验是在受控的环境条件下进行的(例如,相对湿度),测试程序给出的击穿时间显示低散射。给出了不同测试条件对击穿次数和相关数据散射的影响。采用相位参考PD分析仪(PRPDA)系统和视频记录系统,还提供了放电机制和薄膜降解过程的相关信息。描述了测试装置,并给出了与不同厚度聚合物薄膜有关的一些结果。>
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Measuring the endurance of films in partial discharges
A new test assembly for measuring the endurance of polymeric and ceramic films under the action of partial discharges (PDs) is presented. If experiments are performed under controlled ambient conditions (i.e., relative humidity), the test procedure gives times to breakdown which show low scatter. The effects of different test conditions on the times to breakdown and relevant data scatter are presented. The adoption of a phase reference PD analyzer (PRPDA) system, together with a video recording system, also gives information relevant to discharge mechanisms and film degradation processes. The test assembly is described and some results, relevant to polymeric films of different thickness, are presented. >
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