二氧化钒金属绝缘体过渡射频限制器的功率处理

C. Nordquist, D. Leonhardt, J. Custer, T. Jordan, S. Wolfley, S. Scott, Molly N. Sing, M. Cich, C. Rodenbeck
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引用次数: 1

摘要

基于二氧化钒的热触发金属-绝缘体转变,最大功率处理、尖峰泄漏和失效机制已经被表征为限制器。这些特性是由金属绝缘体材料的特性决定的,如通/关电阻比、决定薄膜电阻和器件载流能力的几何特性,以及热特性,如散热和热耦合。带宽大于10 GHz的限制器在2 GHz附近的频率表现为0.5 dB损耗、27 dBm阈值功率、8 Watts阻塞功率和0.4 mJ尖峰泄漏。一个单独的限制器优化为高功率阻挡超过60瓦的入射功率,触发后泄漏小于25 dBm。功率处理显示了这些限制器器件的前景,器件优化为进一步改善尖峰泄漏、响应速度和可靠性提供了机会。
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Power Handling of Vanadium Dioxide Metal-Insulator Transition RF Limiters
Maximum power handling, spike leakage, and failure mechanisms have been characterized for limiters based on the thermally triggered metal-insulator transition of vanadium dioxide. These attributes are determined by properties of the metal-insulator material such as on/off resistance ratio, geometric properties that determine the film resistance and the currentcarrying capability of the device, and thermal properties such as heatsinking and thermal coupling. A limiter with greater than 10 GHz of bandwidth demonstrated 0.5 dB loss, 27 dBm threshold power, 8 Watts blocking power, and 0.4 mJ spike leakage at frequencies near 2 GHz. A separate limiter optimized for high power blocked over 60 Watts of incident power with leakage less than 25 dBm after triggering. The power handling demonstrates promise for these limiter devices, and device optimization presents opportunities for additional improvement in spike leakage, response speed, and reliability.
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