利用光折变晶体中Denisyuk全息图的双曝光干涉测量

Pure and Applied Optics: Journal of The European Optical Society Part A Pub Date : 1998-05-01 DOI:10.1088/0963-9659/7/3/002

S. Riehemann

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引用次数: 1

摘要

在实际应用中，Denisyuk型全息图具有重要的优势。因此，利用这种记录几何结构，开发了一种基于光折变SBN:Ce晶体作为存储材料的紧凑型全息双曝光干涉仪。给出了已实现干涉仪的初步报告，确定了目前的局限性，并提出了进一步改进的建议。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Double-exposure interferometry utilizing Denisyuk holograms in photorefractive crystals

For practical applications, Denisyuk type holograms offer important advantages. So this recording geometry is utilized to develop a compact holographic double-exposure interferometer based on a photorefractive SBN:Ce crystal as storage material. A preliminary report on the realized interferometer is given, present limitations are determined and proposals for further improvements are outlined.

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Pure and Applied Optics: Journal of The European Optical Society Part A

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