INO-ICAL检测器状态

{"title":"INO-ICAL检测器状态","authors":"V. Singh","doi":"10.1007/978-3-319-73171-1_11","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":8827,"journal":{"name":"arXiv: Instrumentation and Detectors","volume":"77 1","pages":"55-58"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Status of INO-ICAL Detector\",\"authors\":\"V. Singh\",\"doi\":\"10.1007/978-3-319-73171-1_11\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":8827,\"journal\":{\"name\":\"arXiv: Instrumentation and Detectors\",\"volume\":\"77 1\",\"pages\":\"55-58\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-10-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"arXiv: Instrumentation and Detectors\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/978-3-319-73171-1_11\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"arXiv: Instrumentation and Detectors","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-319-73171-1_11","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}