{"title":"载流子寿命测量的微波反射:灵敏度和瞬态响应的综合研究","authors":"Martin Schdfthaler, Rolf Brendel","doi":"10.1109/WCPEC.1994.520536","DOIUrl":null,"url":null,"abstract":"The time-resolved microwave reflection technique is widely used for process control in the photovoltaic community. We demonstrate how to optimize the sensitivity and the reliability of carrier lifetime measurements with this method. Our approach is based on a dielectric multilayer model that allows us to calculate microwave reflection transients from excess carrier decay after pulsed laser excitation. We find that the reflected microwave power mirrors the carrier decay only if the reflector is positioned appropriately.","PeriodicalId":20517,"journal":{"name":"Proceedings of 1994 IEEE 1st World Conference on Photovoltaic Energy Conversion - WCPEC (A Joint Conference of PVSC, PVSEC and PSEC)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1994-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Microwave reflections for carrier lifetime measurements: a comprehensive study on sensitivity and transient response\",\"authors\":\"Martin Schdfthaler, Rolf Brendel\",\"doi\":\"10.1109/WCPEC.1994.520536\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The time-resolved microwave reflection technique is widely used for process control in the photovoltaic community. We demonstrate how to optimize the sensitivity and the reliability of carrier lifetime measurements with this method. Our approach is based on a dielectric multilayer model that allows us to calculate microwave reflection transients from excess carrier decay after pulsed laser excitation. We find that the reflected microwave power mirrors the carrier decay only if the reflector is positioned appropriately.\",\"PeriodicalId\":20517,\"journal\":{\"name\":\"Proceedings of 1994 IEEE 1st World Conference on Photovoltaic Energy Conversion - WCPEC (A Joint Conference of PVSC, PVSEC and PSEC)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-12-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1994 IEEE 1st World Conference on Photovoltaic Energy Conversion - WCPEC (A Joint Conference of PVSC, PVSEC and PSEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/WCPEC.1994.520536\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 IEEE 1st World Conference on Photovoltaic Energy Conversion - WCPEC (A Joint Conference of PVSC, PVSEC and PSEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WCPEC.1994.520536","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Microwave reflections for carrier lifetime measurements: a comprehensive study on sensitivity and transient response
The time-resolved microwave reflection technique is widely used for process control in the photovoltaic community. We demonstrate how to optimize the sensitivity and the reliability of carrier lifetime measurements with this method. Our approach is based on a dielectric multilayer model that allows us to calculate microwave reflection transients from excess carrier decay after pulsed laser excitation. We find that the reflected microwave power mirrors the carrier decay only if the reflector is positioned appropriately.
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