电子自旋回波技术研究PM6/Y6和PM6/Y6:YT复合材料的电荷转移态结构

E. A. Lukina, Aina V. Kulikova, M. N. Uvarov, A. Popov, Minghao Liu, Yong Zhang, L. Kulik
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引用次数: 0

摘要

目前,y型非富勒烯受体在有机光伏(OPV)中越来越重要。它们在二元和三元体异质结复合材料中的应用不断提高了OPV器件的效率。然而,三元复合材料的第三组分增强OPV性能的机理却很少被了解。本文利用脉冲EPR技术研究了二元PM6/Y6和三元PM6/Y6:Y-T复合材料光诱导电荷分离过程的异同,PM6为聚合物供体,Y6和Y-T为不同的非富勒烯受体。两种复合材料均检测到异相电子自旋回波信号,该信号是激子分裂在供体/受体界面形成的电荷转移态(CT态)的特征。通过对该信号的分析,得到了构成CT态的电子和空穴之间的距离几乎相同的分布。在这两种情况下,电子-空穴的平均距离都是3.5 nm。这表明,随着Y-T的加入,OPV效率的提高不是由于PM6/Y6:Y-T复合材料的CT态解离概率增加而导致自由电荷的产生。
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Structure of the Charge-Transfer State in PM6/Y6 and PM6/Y6:YT Composites Studied by Electron Spin Echo Technique
Nowadays, Y-shaped non-fullerene acceptors become increasingly important in organic photovoltaics (OPV). Their use in binary and ternary bulk heterojunction composites continuously pushes up the efficiency of OPV devices. However, the mechanism of OPV performance enhancement by the third component of a ternary composite is rarely understood. In the present work, pulse EPR technique was used to reveal the similarities and the differences of photoinduced charge separation process in binary PM6/Y6 and ternary PM6/Y6:Y-T composites, where PM6 is polymer donor, Y6 and Y-T are different non-fullerene acceptors. Out-of-phase electron spin echo signal was detected for both composites, which is the signature of the charge-transfer state (CT state) formed at the donor/acceptor interface upon exciton splitting. Nearly identical distribution of the distances between the electron and the hole constituting the CT state was obtained for these composites from the analysis of this signal. In both cases the average electron-hole distance was 3.5 nm. It implies that OPV efficiency increase with Y-T addition is not caused by the increased probability of CT state dissociation followed by free charge generation for PM6/Y6:Y-T composite.
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来源期刊
Nanomanufacturing and Metrology
Nanomanufacturing and Metrology Materials Science-Materials Science (miscellaneous)
CiteScore
5.40
自引率
0.00%
发文量
36
期刊介绍: Nanomanufacturing and Metrology is a peer-reviewed, international and interdisciplinary research journal and is the first journal over the world that provides a principal forum for nano-manufacturing and nano-metrology.Nanomanufacturing and Metrology publishes in the forms including original articles, cutting-edge communications, timely review papers, technical reports, and case studies. Special issues devoted to developments in important topics in nano-manufacturing and metrology will be published periodically.Nanomanufacturing and Metrology publishes articles that focus on, but are not limited to, the following areas:• Nano-manufacturing and metrology• Atomic manufacturing and metrology• Micro-manufacturing and metrology• Physics, chemistry, and materials in micro-manufacturing, nano-manufacturing, and atomic manufacturing• Tools and processes for micro-manufacturing, nano-manufacturing and atomic manufacturing
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