I. Pazukha, D. Saltykov, Y. Shkurdoda, A. Saltykova, Valerii B. Loboda, V. V. Shchotkin, S. R. Dolgov-Gordiichuk
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引用次数: 0
摘要
本文介绍了在钴原子浓度为$10\leq c\mathrm{c}_{0}\leq 90$ at的条件下,以厚度为20 ~ 50 nm的$\mathrm{Fe}_{\mathrm{x}}\mathrm{Co}1-\mathrm{x}$铁磁合金和Cu铁磁合金为基体的三组分薄膜合金的磁阻效应和磁性参数的研究结果。%. It is shown that for film alloys $\mathrm{Fe}_{\mathrm{x}}\mathrm{C}_{01-\mathrm{x}}$ in the entire range of studied concentrations and thicknesses at room temperature, the anisotropic nature of magnetoresistance is recorded, while for films $(\mathrm{Fe}_{\mathrm{x}}\mathrm{C}_{01-\mathrm{x}})_{0.5}\mathrm{C}_{\mathrm{u}0.5}$ at $x\gt 0.6$ the magnetoresistance has an isotropic character. The dependences of the values of the coercive force BC and the saturation field BS on the content of Fe x atoms for film alloys $\mathrm{Fe}_{\mathrm{x}}\mathrm{Co}1-\mathrm{x}/\mathrm{S}$ $Ta (\mathrm{Fe}_{\mathrm{x}}\mathrm{c}_{01-\mathrm{x}})_{0.5}\mathrm{C}_{\mathrm{u0.5}}/\mathrm{S}$ with a thickness of 30 nm are analyzed.
Magnetoresistive Effect and Magnetic Paraneters of Nanocrystalline Thin-film Alloys Based on Co, Fe and Cu
The paper presents the results of studies of the magnetoresistance effect and magnetic parameters of three-component film alloys based on the ferromagnetic alloy $\mathrm{Fe}_{\mathrm{x}}\mathrm{Co}1-\mathrm{x}$ and Cu with a thickness of 20-50 nm and at a concentration of cobalt atoms of $10\leq c\mathrm{c}_{0}\leq 90$ aT.%. It is shown that for film alloys $\mathrm{Fe}_{\mathrm{x}}\mathrm{C}_{01-\mathrm{x}}$ in the entire range of studied concentrations and thicknesses at room temperature, the anisotropic nature of magnetoresistance is recorded, while for films $(\mathrm{Fe}_{\mathrm{x}}\mathrm{C}_{01-\mathrm{x}})_{0.5}\mathrm{C}_{\mathrm{u}0.5}$ at $x\gt 0.6$ the magnetoresistance has an isotropic character. The dependences of the values of the coercive force BC and the saturation field BS on the content of Fe x atoms for film alloys $\mathrm{Fe}_{\mathrm{x}}\mathrm{Co}1-\mathrm{x}/\mathrm{S}$ $Ta (\mathrm{Fe}_{\mathrm{x}}\mathrm{c}_{01-\mathrm{x}})_{0.5}\mathrm{C}_{\mathrm{u0.5}}/\mathrm{S}$ with a thickness of 30 nm are analyzed.