聚苯乙烯薄膜中热刺激电流和电荷衰减的研究

Ranjit J. Singh, S. Datt
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引用次数: 0

摘要

对25 μm厚的单向真空镀铝聚苯乙烯样品进行了热激电荷衰减(TSCD)和短路热激电流(TSCs)的研究,并对其进行了负电晕充电,电晕电压为6 ~ 9 kV,温度为40℃及以上。在70°C以上充电的样品中,电荷稳定性大大增加,这被认为是由于在较高的充电温度下,电荷载流子在深阱中定位。这些结果支持了高温电晕充电可以获得适合实际使用的稳定驻极体的观点。
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Thermally stimulated current and charge decay studies in polystyrene thin films
Investigation of thermally stimulated charge decay (TSCD) and of short-circuit thermally stimulated currents (TSCs) was undertaken in one-sided vacuum aluminized 25 μm thick polystyrene samples subjected to negative corona charging with corona voltages ranging from 6 to 9 kV at temperatures 40°C and above. Charge stability has been found to increase considerably in samples charged above 70°C# This has been considered to be due to the localization of charge carriers in deep traps at higher charging temperatures. These results support the view that the stable electrets suitable for practical use can be obtained by high-temperature corona charging.
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