Sung-Uk Jang, S. Hyun, Hwan-Soo Lee, Soon-Ju Kwon, Ji-Hong Kim, K. Park, Hak-Joo Lee
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In-situ synchrotron X-ray diffraction measurement of epitaxial FeRh thin films
The magnetic properties and structure of FeRh thin film epitaxially grown onto MgO(001) substrate were studied by MPMS(Magnetic Properties Measure System) and in-situ temperature synchrotron XRD(X-ray Diffraction). The transition temperature of FeRh thin films was around 380K. Both M-T curve and d-spacing changes correspond to each other very closely. Abrupt changes in the lattice constants can be observed from the in-situ analysis. Also, there is the likelihood of existence of a new phase.
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