硅中晶体缺陷的吸污效率研究

July 16 Pub Date : 1984-07-16 DOI:10.1002/PSSA.2210840117
E. Bugiel, M. Kittler, A. Borchardt, H. Richter
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引用次数: 13

摘要

围绕着危机的假设,应对危机的方法令人担忧:ebrd / tem的研究表明,在任意改变率升高的次序会得出这样的假设:
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On the Gettering Efficiency of Crystal Defects in Silicon
The following hypothesis concerning the order of increasing gettering efficiency of different dislocation types is deduced from ebic/TEM investigations: stair rod partials, Shockley partials, complete dislocations, Frank partials. Aus ebic/TEM-Untersuchungen wird folgende Hypothese bezuglich der Reihenfolge des Anstieges der Gettereffektivitat versehiedener Versetzungstypen ermittelt: Stair Rod Partialversetzungen, Shockley'sche Partialversetzungen, vollstandige Versetzungen, Frank'sche Partialversetzungen.
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