粗糙导体接触处的无源互调

Amir Dayan, Yi Huang, A. Schuchinsky
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引用次数: 10

摘要

无源互调(PIM)是影响现代通信和导航系统性能的一个恼人的现象。PIM产品干扰信息信号,造成信息信号的非线性失真。虽然已有文献对PIM的来源和基本机制进行了研究,但PIM仍然是一个严重的信号完整性问题。本文讨论了良导体接头产生PIM的主要来源和机理。结果表明,被动的电、热、机械非线性虽然时间尺度不同,但具有内在的联系。接触面粗糙度对导体接头产生PIM有重要影响。对良好导体接触处的PIM现象学的回顾表明,对于由多种物理性质的非线性并发产生的PIM产品的分析和可靠预测,需要新的多物理场模型。
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Passive Intermodulation at Contacts of Rough Conductors
Passive intermodulation (PIM) is a niggling phenomenon that debilitates the performance of modern communications and navigation systems. PIM products interfere with information signals and cause their nonlinear distortion. The sources and basic mechanisms of PIM have been studied in the literature but PIM remains a serious problem of signal integrity. In this paper, the main sources and mechanisms of PIM generation by joints of good conductors are discussed. It is shown that the passive electrical, thermal and mechanical nonlinearities are intrinsically linked despite their distinctively different time scales. The roughness of the contact surfaces plays an important role in PIM generation by conductor joints. A review of the PIM phenomenology at the contacts of the good conductors suggests that novel multiphysics models are necessary for the analysis and reliable prediction of PIM products generated by several concurrent nonlinearities of a diverse physical nature.
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