在嵌入式汇编代码模型检查中使用3值内存表示进行状态空间缩减

T. Reinbacher, M. Horauer, Bastian Schlich
{"title":"在嵌入式汇编代码模型检查中使用3值内存表示进行状态空间缩减","authors":"T. Reinbacher, M. Horauer, Bastian Schlich","doi":"10.1109/DDECS.2009.5012109","DOIUrl":null,"url":null,"abstract":"Model checking of assembly code is a promising approach to satisfy the demand for verification in nowadays ultra-high reliable embedded systems software. Frequent interaction with its environment, e.g., by sending or reading data over the microcontrollers I/O lines, lies in the nature of embedded systems. Thus, making the long-standing problem of explicit-model checking even worse, namely the state-explosion problem. This paper presents a concept to tackle these difficulties by using a 3-valued logic in the state representation and showing its benefits in terms of state-space savings whenever logic operations are executed by the target microcontroller. To highlight the effectiveness of this approach, termed delayed nondeterminism with look ahead, an embedded program exemplifying typical microcontroller source code is analyzed and the resulting state space sizes are discussed. The introduced abstraction technique is implemented in the MCS-51 simulator component for the [mc]square model checker which is developed by the RWTH Aachen University.","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"42 1","pages":"114-119"},"PeriodicalIF":0.0000,"publicationDate":"2009-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Using 3-valued memory representation for state space reduction in embedded assembly code model checking\",\"authors\":\"T. Reinbacher, M. Horauer, Bastian Schlich\",\"doi\":\"10.1109/DDECS.2009.5012109\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Model checking of assembly code is a promising approach to satisfy the demand for verification in nowadays ultra-high reliable embedded systems software. Frequent interaction with its environment, e.g., by sending or reading data over the microcontrollers I/O lines, lies in the nature of embedded systems. Thus, making the long-standing problem of explicit-model checking even worse, namely the state-explosion problem. This paper presents a concept to tackle these difficulties by using a 3-valued logic in the state representation and showing its benefits in terms of state-space savings whenever logic operations are executed by the target microcontroller. To highlight the effectiveness of this approach, termed delayed nondeterminism with look ahead, an embedded program exemplifying typical microcontroller source code is analyzed and the resulting state space sizes are discussed. The introduced abstraction technique is implemented in the MCS-51 simulator component for the [mc]square model checker which is developed by the RWTH Aachen University.\",\"PeriodicalId\":6325,\"journal\":{\"name\":\"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems\",\"volume\":\"42 1\",\"pages\":\"114-119\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-04-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DDECS.2009.5012109\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2009.5012109","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

汇编代码的模型检验是满足当今超高可靠性嵌入式系统软件验证需求的一种很有前途的方法。与环境的频繁交互,例如,通过微控制器的I/O线发送或读取数据,是嵌入式系统的本质。从而使长期存在的显式模型检查问题,即状态爆炸问题变得更加严重。本文提出了一个概念,通过在状态表示中使用3值逻辑来解决这些困难,并在目标微控制器执行逻辑操作时显示其在状态空间节省方面的好处。为了强调这种方法的有效性,称为具有前瞻性的延迟不确定性,本文分析了典型微控制器源代码的嵌入式程序,并讨论了结果状态空间大小。所介绍的抽象技术在亚琛工业大学开发的[mc]方形模型检查器的MCS-51模拟器组件中实现。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Using 3-valued memory representation for state space reduction in embedded assembly code model checking
Model checking of assembly code is a promising approach to satisfy the demand for verification in nowadays ultra-high reliable embedded systems software. Frequent interaction with its environment, e.g., by sending or reading data over the microcontrollers I/O lines, lies in the nature of embedded systems. Thus, making the long-standing problem of explicit-model checking even worse, namely the state-explosion problem. This paper presents a concept to tackle these difficulties by using a 3-valued logic in the state representation and showing its benefits in terms of state-space savings whenever logic operations are executed by the target microcontroller. To highlight the effectiveness of this approach, termed delayed nondeterminism with look ahead, an embedded program exemplifying typical microcontroller source code is analyzed and the resulting state space sizes are discussed. The introduced abstraction technique is implemented in the MCS-51 simulator component for the [mc]square model checker which is developed by the RWTH Aachen University.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Operational amplifiers D.C. circuits Test equipment and measurements The PIC microcontroller Circuit construction
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1