x射线荧光分析硅酸盐的自洽质量吸收校正

J.G. Holland, D.W. Brindle
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引用次数: 34

摘要

偏离比例是x射线荧光分析误差的主要来源。通过仔细制备样品和同样仔细地操作光谱仪,这些偏差可以限制在样品间总质量吸收的差异。为了消除或估计这些差异,已经描述了各种方法;但没有一种方法得到普遍应用。自洽质量吸收校正方法没有前人的缺点。在对整个化学过程没有任何预先假设的情况下,首先通过直接参考标准来计算未知物质的近似组成。利用这一近似组成,确定了每个工作波长的未知物质的总吸收质量,然后利用这一信息对未知物质的组成作出更准确的估计。这种更精确的估计为确定每个波长的总质量吸收的更精确的值提供了手段。因此,通过迭代过程,获得自洽的化学成分,然后通过参考一组标准,使用二次回归关系,对比例性的其他偏差进行校正。虽然这种方法到目前为止只应用于整个岩石的分析,但它的应用可以证明是更广泛的,因为所描述的计算机程序是这样构建的,通过简单地交换矩阵块和参考标准,可以在整个x射线光谱范围内进行分析。
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A self-consistent mass absorption correction for silicate analysis by X-ray fluorescence

Deviations from proportionality form the major source of error in X-ray fluorescent analysis. By careful preparation of the sample and equally careful operation of the spectrograph these deviations can be confined to inter-sample differences in total mass absorption. In order to eliminate or estimate these differences a variety of methods have been described; but none have found universal application. The method of a self-consistent mass absorption correction does not share the shortcomings of its predecessors. Without any pre-supposition regarding the over-all chemistry, an approximate composition of the unknown is first calculated by direct reference to a standard. Using this approximate composition the total mass absorption of the unknown is determined for each operational wavelength, and this information then used to make a more accurate estimate of the composition of the unknown. This more accurate estimate provides the means for determining a yet more accurate value for the total mass absorption at each wavelength. Thus, by an iterative process, a self-consistent chemical composition is obtained, and this value is then corrected for other deviations from proportionality by reference to a set of standards, using a quadratic regression relationship. Although this method has only been applied so far to whole rock analyses, its application could prove to be much more extensive, for the computer programme described is so constructed that, by a simple interchange of the matrix block and reference standards, analyses could be made within the entire range of the X-ray spectrum.

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