低温下小分子固体的二次离子质谱分析。V[1]。氧气

Dusan Stulik, Robert G. Orth, Harry T. Jonkman, Josef Michl
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引用次数: 20

摘要

测定了纯固体O2和用氩气稀释O2在15 ~ 20k条件下的正二次离子质谱与主离子(He+, Ar+, Kr+, 0.5 ~ 4.0 keV)性质和能量的关系。对于He+,固体O2的光谱以O2和O+峰为主,对于Ar+和Kr+,则以O+3n+2, n = 0,1,2....的强烈簇系为主
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Secondary ion mass spectrometry of small-molecule solids at cryogenic temperatures. V [1]. Oxygen

Positive secondary ion mass spectra of neat solid O2 and O2 diluted with argon at 15–20K were measured as a function of the nature and energy of the primary ions (He+, Ar+, Kr+, 0.5–4.0 keV). With He+, the spectrum of solid O2 is dominated by O2 and O+ peaks, with Ar+ and Kr+, it is dominated by an intense cluster series O+3n+2, n = 0,1,2….

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Editorial Subject index Author index High resolution accurate mass measurements of FAB-generated ions by use of peak matching and multichannel analyzer techniques. Secondary ion mass spectrometry of low-temperature solids
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