DOI:10.1109/RFIT.2015.7377913
作者:M. Je, J. Cheong, C. Ho, Simon Sheung Yan Ng, Rui-Feng Xue, Hyouk-Kyu Cha, Xin Liu, W. Park, L. Lim, Cairan He, Kuang-Wei Cheng, X. Zou, Zhiming Chen, Lei Yao, San-Jeow Cheng, Peng Li, Lei Liu, Ming-Y
文献类型:期刊论文
补充材料:只需要正文
Institute of Electrical and Electronics Engineers (IEEE)