Proceedings Electrical Overstress/Electrostatic Discharge Symposium

Does The Esd-failure Current Obtained By Transmissionline Pulsing Always Correlate To Human Body Model Tests?

Pub Date : 1998-11-01 DOI: 10.1016/S0026-2714(98)00180-2 W. Stadler, X. Guggenmos, P. Egger, O. Gieser, C. Musshoff

A Study Of ESD Protection Devices For Input Pins Discharge Characteristics Of Diode, Lateral Bipolar Transistor And Thyristor Under Mm And Hbm Tests

Pub Date : 1998-10-01 DOI: 10.1109/3476.739175 H. Ishizuka, K. Okuyama, K. Kubota, M. Komuro, Y. Hara

Protection of high voltage power and programming pins

Pub Date : 1998-10-01 DOI: 10.1109/3476.739174 T. Maloney, K. Parat, N. K. Clark, A. Darwish