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ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003.

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ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003.

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ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. - 最新文献

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Influence of gate width on 50 nm gate length Si/sub 0.7/Ge/sub 0.3/ channel PMOSFETs

Pub Date : 2003-09-16 DOI: 10.1109/ESSDERC.2003.1256930 M. von Haartman, A. Lindgren, P. Hellstrom, M. Ostling, T. Ernst, L. Brevard, S. Deleonibus

Optimization of electrothermal material parameters using inverse modeling [polysilicon fuse interconnects]

Pub Date : 2003-09-16 DOI: 10.1109/ESSDERC.2003.1256889 R. Minixhofer, S. Holzer, C. Heitzinger, J. Fellner, T. Grasser, S. Selberherr

Silicon carbide accumulation-mode laterally diffused MOSFET

Pub Date : 2003-09-16 DOI: 10.1109/ESSDERC.2003.1256943 T. Ayalew, Jong-Mun Park, A. Gehring, T. Grasser, S. Selberherr
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