2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

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2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - 最新文献

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Rebooting Computing: The Challenges for Test and Reliability

Pub Date : 2019-10-02 DOI: 10.1109/DFT.2019.8875270 A. Bosio, Ian O’Connor, G. Rodrigues, F. Kastensmidt, E. Vatajelu, G. D. Natale, L. Anghel, S. Nagarajan, M. Fieback, S. Hamdioui

A Low Capture Power Oriented X-filling Method Using Partial MaxSAT Iteratively

Pub Date : 2019-10-01 DOI: 10.1109/DFT.2019.8875434 Toshinori Hosokawa, Hiroshi Yamazaki, Kenichiro Misawa, Masayoshi Yoshimura, Yuki Hirama, Masavuki Arai

State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State Machines

Pub Date : 2019-10-01 DOI: 10.1109/DFT.2019.8875383 H. Ichihara, Y. Maeda, T. Iwagaki, Tomoo Inoue

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