2005 66th ARFTG Microwave Measurement Conference (ARFTG)

504

微信好友朋友圈 QQ好友复制链接

查看最新文献

发文信息

2005 66th ARFTG Microwave Measurement Conference (ARFTG) - 最新文献

查看全部

A novel measurement technique for demonstrating carbon nanotube FET operation at microwave frequencies

Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373118 A. Pesetski, J. Baumgardner, J. Murduck, Eric N. Folk, J. Przybysz, J. Adam, Hong Zhang

Interlaboratory comparison of noise-parameter measurements on CMOS devices with 0.12 μm gate length

Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373127 A. Pesetski, J. Baumgardner, J. Murduck, Eric N. Folk, J. Przybysz, J. Adam, Hong Zhang, J. Verspecht, D. Barataud, J. Teyssier, J. Nebus, Choongeol Cho, P. Hale, D. I. Bergman, D. Keenan, Nazia Akil, B. Grossman, H. Arslan, Daljeet Singh, J. Randa, S. Sweeney, T. Mckay, D. Walker, D. Greenberg, J. Tao, Judah Mendez, G. A. Rezvani, J. Pekarik

Comparison of multisine measurements from instrumentation capable of nonlinear system characterization

Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373122 K. Remley, P. Hale, D. I. Bergman, D. Keenan

免责声明：
本页显示期刊或杂志信息，仅供参考学习，不是任何期刊杂志官网，不涉及出版事务，特此申明。如需出版一切事务需要用户自己向出版商联系核实。若本页展示内容有任何问题，请联系我们，邮箱：info@booksci.cn，我们会认真核实处理。