Accuracy of non-contact semiconductor X-ray analyzer for quality assurance in intraoral radiography: a comparison with ionization chamber dosimeter.

IF 1.6 3区医学 Q3 DENTISTRY, ORAL SURGERY & MEDICINE Oral Radiology Pub Date : 2023-10-01 Epub Date: 2023-06-15 DOI:10.1007/s11282-023-00692-9

Shun Nouchi, Hidenori Yoshida, Yusaku Miki, Yasuhito Tezuka, Ruri Ogawa, Ichiro Ogura

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Abstract

Objectives: The aim of the present study was to evaluate the accuracy of a non-contact semiconductor X-ray analyzer for quality assurance in intraoral radiography, especially a comparison with an ionization chamber dosimeter.

Methods: Intraoral radiography was performed with intraoral X-ray unit using the dental protocol at our hospital: tube voltage, 70 kV; tube current, 7 mA. Accuracy of dose and half-value layer (HVL) measurements was analyzed with a non-contact semiconductor X-ray analyzer and an ionization chamber dosimeter. Stability of the semiconductor sensor, effect of scattered radiation, and comparison of measured HVL between the ionization chamber and the semiconductor sensor were analyzed in this study.

Results: The values with the semiconductor sensor were tube voltage: 70.3 ± 0.2 kVp (degree of variability: 0.28%), dose: 454.1 ± 12.3 μGy (degree of variability: 2.7%), and HVL: 1.91 ± 0.02 mmAl (degree of variability: 1.0%). With collimator, the dose with the semiconductor sensor and the ionization chamber decreased by 2.3 μ Gy and 5.2 μ Gy, respectively. The measured HVL of the semiconductor dosimeter was more than that of ionization chamber, and the semiconductor dosimeter was less than ionization chamber in variation of between without and with collimator.

Conclusion: This study indicated the accuracy of a non-contact semiconductor X-ray analyzer for quality assurance in intraoral radiography, especially a comparison with an ionization chamber dosimeter. The semiconductor sensor can be useful for quality assurance in intraoral radiography.

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非接触式半导体X射线分析仪在口腔射线照相质量保证中的准确性：与电离室剂量计的比较。

目的：本研究的目的是评估非接触式半导体X射线分析仪在口腔内放射照相质量保证方面的准确性，特别是与电离室剂量计的比较。方法：使用口腔内X射线装置进行口腔造影，使用我院的牙科协议：管电压，70 kV；管电流，7毫安。用非接触式半导体X射线分析仪和电离室剂量计分析了剂量和半值层（HVL）测量的准确性。本研究分析了半导体传感器的稳定性、散射辐射的影响以及电离室和半导体传感器之间测量的HVL的比较。结果：半导体传感器的值为管电压：70.3 ± 0.2 kVp（变异程度：0.28%），剂量：454.1 ± 12.3μGy（变异度：2.7%），HVL:1.91 ± 0.02mmAl（变化程度：1.0%）。使用准直器，半导体传感器和电离室的剂量分别减少了2.3μGy和5.2μGy。半导体剂量计测得的HVL大于电离室，而半导体剂量计在无准直器和有准直器之间的变化小于电离室。结论：本研究表明了非接触式半导体X射线分析仪在口腔内放射照相质量保证方面的准确性，特别是与电离室剂量计的比较。半导体传感器可用于口腔内放射照相术的质量保证。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Oral Radiology DENTISTRY, ORAL SURGERY & MEDICINE-

CiteScore

4.20

自引率

13.60%

发文量

审稿时长

>12 weeks

期刊介绍： As the official English-language journal of the Japanese Society for Oral and Maxillofacial Radiology and the Asian Academy of Oral and Maxillofacial Radiology, Oral Radiology is intended to be a forum for international collaboration in head and neck diagnostic imaging and all related fields. Oral Radiology features cutting-edge research papers, review articles, case reports, and technical notes from both the clinical and experimental fields. As membership in the Society is not a prerequisite, contributions are welcome from researchers and clinicians worldwide.