Scalable selector architecture for X-tolerant deterministic BIST

Abstract

X-tolerant deterministic BIST (XDBIST) was recently presented as a method to efficiently compress and apply scan patterns generated by automatic test pattern generation (ATPG) in a logic built-in self-test architecture. In this paper we introduce a novel selector architecture that allows arbitrary compression ratios, scales to any number of scan chains and minimizes area overhead. XDBIST test-coverage, full X-tolerance and scan-based diagnosis ability are preserved and are the same as deterministic scan-ATPG.