{"title":"An ICA based prediction method for EMI and EMC","authors":"Liu Hongyi, Wen Xi, Xie Shuguo, Zhao Di","doi":"10.1109/ISRA.2012.6219180","DOIUrl":null,"url":null,"abstract":"This article mainly discusses the evaluation and prediction method for the electromagnetic interference and electromagnetic compatibility of electronic devices or systems. An Independent Component Analysis (ICA) based method is introduced in order to separate or recover source electromagnetic signals and interfering signals from mixed signals. A simulation experiment is also given to demonstrate the validity and feasibility of the proposed method. Finally, a process scheme by combining the ICA based method and system method is proposed, in order to help design and analyze the EMC performance of electronic devices and systems.","PeriodicalId":266930,"journal":{"name":"2012 IEEE Symposium on Robotics and Applications (ISRA)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE Symposium on Robotics and Applications (ISRA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISRA.2012.6219180","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
This article mainly discusses the evaluation and prediction method for the electromagnetic interference and electromagnetic compatibility of electronic devices or systems. An Independent Component Analysis (ICA) based method is introduced in order to separate or recover source electromagnetic signals and interfering signals from mixed signals. A simulation experiment is also given to demonstrate the validity and feasibility of the proposed method. Finally, a process scheme by combining the ICA based method and system method is proposed, in order to help design and analyze the EMC performance of electronic devices and systems.
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