Near-field characterization of photonic crystal components

V. Volkov, S. Bozhevolnyi, P. Borel, L. Frandsen, M. Kristensen
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Abstract

In this paper, we have employed a collection scanning near-field optical microscope (SNOM) for imaging of the propagation of light at telecommunication wavelengths along straight and bent photonic crystal (PC) waveguides with Y-splitters, Z-bends and simple couplers that were fabricated on silicon-on-insulator (SOl) wafers
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光子晶体元件的近场特性
在本文中,我们使用了一种集合扫描近场光学显微镜(SNOM)来成像光在电信波长沿直线和弯曲光子晶体(PC)波导的传播,这些波导具有y分路,z弯曲和简单的耦合器,这些波导是在绝缘体上的硅(SOl)晶圆上制造的
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