{"title":"A SOLR calibration procedure for the 16-term error model","authors":"M. Schramm, M. Hrobak, J. Schur, L. Schmidt","doi":"10.23919/EUMC.2012.6459245","DOIUrl":null,"url":null,"abstract":"Scattering parameter measurements in the presence of crosstalk is a well documented problem. The available calibration methods, suited for the general 16-term error model, capable of taking the crosstalk into account, suffer from the required Thru-Standard, which has to be perfectly known. This information is hard to acquire in some cases. An approach which makes the advantage of the 7-term SOLR (Short-Open-Load-Reciprocal) accessible to the 16-term error model is discussed in this article. The mathematical description, the feasibility for multiport applications, measurement results and a brief sensitivity analysis will be presented.","PeriodicalId":266910,"journal":{"name":"2012 42nd European Microwave Conference","volume":"85 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 42nd European Microwave Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/EUMC.2012.6459245","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
Scattering parameter measurements in the presence of crosstalk is a well documented problem. The available calibration methods, suited for the general 16-term error model, capable of taking the crosstalk into account, suffer from the required Thru-Standard, which has to be perfectly known. This information is hard to acquire in some cases. An approach which makes the advantage of the 7-term SOLR (Short-Open-Load-Reciprocal) accessible to the 16-term error model is discussed in this article. The mathematical description, the feasibility for multiport applications, measurement results and a brief sensitivity analysis will be presented.