Optimize defect detection techniques through empirical software engineering method

H. T. Sun
{"title":"Optimize defect detection techniques through empirical software engineering method","authors":"H. T. Sun","doi":"10.1109/EIT.2005.1627056","DOIUrl":null,"url":null,"abstract":"This paper introduces twelve defect detection techniques and describes a non-controlled experiment related to defect detection techniques to address the uncertainty of how to test an embedded software and find defects effectively. In this non-controlled experiment, three common testing techniques were applied to a large scale embedded system. This study is intended to evaluate different defect detection techniques that are actually used by software engineers using empirical software engineering method. The objective of empirical software engineering is to improve the software development processes and quality. This could be done by evaluating, comparing and controlling defect detection methods. This study is also intended to find a best method to reduce defects and increase the defect detection rate in a large scale embedded system, since defect detection is considered as one of the most costly development process in software development cycle","PeriodicalId":358002,"journal":{"name":"2005 IEEE International Conference on Electro Information Technology","volume":"50 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 IEEE International Conference on Electro Information Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EIT.2005.1627056","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

This paper introduces twelve defect detection techniques and describes a non-controlled experiment related to defect detection techniques to address the uncertainty of how to test an embedded software and find defects effectively. In this non-controlled experiment, three common testing techniques were applied to a large scale embedded system. This study is intended to evaluate different defect detection techniques that are actually used by software engineers using empirical software engineering method. The objective of empirical software engineering is to improve the software development processes and quality. This could be done by evaluating, comparing and controlling defect detection methods. This study is also intended to find a best method to reduce defects and increase the defect detection rate in a large scale embedded system, since defect detection is considered as one of the most costly development process in software development cycle
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
通过经验软件工程方法优化缺陷检测技术
本文介绍了12种缺陷检测技术,并描述了一个与缺陷检测技术相关的非控制实验,以解决如何有效地测试嵌入式软件并发现缺陷的不确定性。在这个非对照实验中,三种常用的测试技术应用于一个大型嵌入式系统。本研究旨在评估软件工程师使用经验软件工程方法实际使用的不同缺陷检测技术。经验软件工程的目标是改进软件开发过程和质量。这可以通过评估、比较和控制缺陷检测方法来实现。在大规模嵌入式系统中,缺陷检测被认为是软件开发周期中成本最高的开发过程之一,因此本研究旨在寻找一种减少缺陷和提高缺陷检出率的最佳方法
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Carry-save and binary sign-digit representations conversion Energy macro-modeling of embedded microprocessor using SystemC A proportional rate-based control scheme for active queue management Hierarchical clustering for image databases Theft-induced checkpointing for reconfigurable dataflow applications
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1