Test and characterization of 1 bit Σ — Δ modulator

Abstract

This paper presents a built-in self test (BIST) methodology to measure offset error and gain error of SigmaDelta modulator. This structure is made up of a generator of stimulus and an analyzer of response. We propose a digital technique for the test of static characteristics of the modulator. A memory based signal generator is presented which can concurrently produce test stimuli and reference signals. A first order SigmaDelta is evaluated and the simulation results show the static errors effect on the modulator bitstream output.