A Universal Model for Defective Classes Prediction Using Different Object-Oriented Metrics Suites

F. A. Mohamed, Cherif R. Salama, A. Yousef, Ashraf Salem
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引用次数: 1

Abstract

Recently, research studies were directed to the construction of a universal defect prediction model. Such models are trained using different projects to have enough training data and be generic. One of the main challenges in the construction of a universal model is the different distributions of metrics in various projects. In this study, we aim to build a universal defect prediction model to predict software defective classes. We also aim to validate the Object-Oriented Cognitive Complexity metrics suite (CC metrics) for its association with fault-proneness. Finally, this study aims to compare the prediction performances of the CC metrics and the Chidamber and Kemerer metrics suite (CK metrics), taking into account the effect of preprocessing techniques. A neural network model is constructed using these 2 metrics suites (CK & CC metrics suites). We apply different preprocessing techniques on these metrics to overcome variations in their distributions. The results show that the CK metrics perform well whether a preprocessing is applied or not, while CC metrics’ performance is significantly affected by different preprocessing techniques. The CC metrics always outperform in the recall, while the CK metrics usually outperform in other performance metrics. Normalization preprocessing results in the highest recall values using either of the two metrics suites.
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基于不同面向对象度量套件的缺陷类预测通用模型
近年来,研究的重点是建立通用的缺陷预测模型。这些模型使用不同的项目进行训练,以获得足够的训练数据并具有通用性。构建通用模型的主要挑战之一是各种项目中度量标准的不同分布。在本研究中,我们的目标是建立一个通用的缺陷预测模型来预测软件缺陷类别。我们还旨在验证面向对象的认知复杂性度量套件(CC度量)与错误倾向的关联。最后,考虑到预处理技术的影响,本研究旨在比较CC指标和Chidamber和Kemerer指标套件(CK指标)的预测性能。使用这两个度量套件(CK和CC度量套件)构建神经网络模型。我们对这些指标应用不同的预处理技术来克服其分布的变化。结果表明,无论是否进行预处理,CK指标的性能都很好,而CC指标的性能受不同预处理技术的影响较大。CC指标在召回方面总是优于CK指标,而CK指标通常在其他性能指标方面优于CK指标。使用两个度量套件中的任何一个,规范化预处理都会产生最高的召回值。
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