{"title":"Crosstalk-Insensitive Method for Testing of Delay Faults in Interconnects Between Cores in SoCs","authors":"T. Garbolino, K. Gucwa, M. Kopec, A. Hlawiczka","doi":"10.1109/MIXDES.2007.4286213","DOIUrl":null,"url":null,"abstract":"A method for reliable measurement of interconnect delays is presented in the paper. The mode of test vectors generation never induces crosstalks. That is why the delay measurement is reliable. Also, minimization of ground bounce noises and reduction of power consumption during the test is an additional advantage. The presented method allows also localizing and identifying static faults of both stuck-at (SaX) and short types. The paper deals with the hardware that is necessary for implementing the method. The techniques for test data compression, that allow substantial reduction of data volume transferred between SoC and ATE, are also proposed.","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MIXDES.2007.4286213","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
A method for reliable measurement of interconnect delays is presented in the paper. The mode of test vectors generation never induces crosstalks. That is why the delay measurement is reliable. Also, minimization of ground bounce noises and reduction of power consumption during the test is an additional advantage. The presented method allows also localizing and identifying static faults of both stuck-at (SaX) and short types. The paper deals with the hardware that is necessary for implementing the method. The techniques for test data compression, that allow substantial reduction of data volume transferred between SoC and ATE, are also proposed.
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