An 8MHz 31.25kS/s Impedance-Monitoring IC Based on IF-Sampling Architecture with a Band-Pass Delta-Sigma ADC

Soon-Jae Kweon, Joonho Gil, Chulhyun Park, Sein Oh, Yoontae Jung, Injun Choi, Song-I Cheon, Hung Phan Dang, Ja-Hyuck Koo, Geunhoe Kim, S. Ha, M. Je
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引用次数: 2

Abstract

We present an impedance-monitoring IC achieving a wide frequency range (FR) and fast output data rate (ODR). The proposed IC support a wide FR with improved spectral density by down-converting the signal to the intermediate frequency (fIF) in front of the instrumentation amplifier (IA) using the LO signal generated by a single-side-band (SSB) mixer. The proposed IF-sampling architecture does not require narrow-bandwidth (BW) low-pass filter (LPF), resulting in a fast ODR. A time-interleaved (TI) DFT is also employed to further improve the ODR. A band-pass delta-sigma ADC (BP-ΔΣ-ADC) with the auto-calibration and BP truncation is adopted to achieve the best noise performance at fIF. The fabricated IC achieves 0.35ΩRMS resolution in the FR from 4kHz to 8MHz with 122.1Hz BW while providing the ODR up to 31.25kS/s.
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基于中频采样架构的8MHz 31.25kS/s阻抗监测IC,带通Delta-Sigma ADC
我们提出了一种实现宽频率范围(FR)和快速输出数据速率(ODR)的阻抗监测IC。所提出的集成电路通过使用单边带混频器(SSB)产生的LO信号在仪表放大器(IA)前将信号下变频到中频(fIF),从而支持宽FR和改进的频谱密度。所提出的中频采样架构不需要窄带带宽(BW)低通滤波器(LPF),从而实现快速的ODR。还采用了时间交错(TI) DFT来进一步提高ODR。采用带通δ - σ ADC (BP-ΔΣ-ADC),具有自动校准和BP截断功能,可在fIF下获得最佳噪声性能。制造的IC在4kHz至8MHz的FR中实现0.35ΩRMS分辨率,BW为122.1Hz, ODR高达31.25kS/s。
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