Wideband complementary CMOS VCO with capacitive-source-degeneration technique

M. Wei, R. Negra, Sheng-Fuh Chang, Chih-Sheng Chen
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引用次数: 3

Abstract

This paper demonstrates a wideband complementary LC-VCO using capacitive-source-degeneration (CSD) technique for WiFi and LTE applications. A cross-coupling pair is required to generate suitable-gm but the parasitic capacitance of the pair leads to a reduction of capacitance ratio of varactors and thus, tuning range of a VCO. Properly designing source-degeneration capacitance can relieve this reduction and optimum capacitance is discussed in this paper. The chip is fabricated in 180 nm CMOS and has a chip area of 0.43 mm2. The measured oscillation frequency is from 2.22 GHz to 2.94 GHz (27.9 %) and the lowest phase noise is −122.5 dBc/Hz at 1MHz offset at 2.87 GHz. The core power dissipation is 3.6 mW from a supply voltage of 1.8 V and FOM of −186 dBc/Hz is achieved.
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采用电容源退化技术的宽带互补CMOS压控振荡器
本文演示了一种宽带互补LC-VCO,使用电容源退化(CSD)技术用于WiFi和LTE应用。交叉耦合对需要产生合适的耦合,但耦合对的寄生电容导致变容管的电容比减小,从而降低了压控振荡器的调谐范围。合理设计源退化电容可以缓解这种衰减,并对最佳电容进行了讨论。该芯片采用180nm CMOS工艺制造,芯片面积为0.43 mm2。测量的振荡频率范围为2.22 ~ 2.94 GHz(27.9%),在2.87 GHz的1MHz偏移处,最低相位噪声为- 122.5 dBc/Hz。电源电压为1.8 V时,核心功耗为3.6 mW, FOM为−186 dBc/Hz。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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