Suyu Yang, Benjamin J. Orr, Yuangdong Guo, Yilong Zhang, D. Pommerenke, H. Shumiya, J. Maeshima, Taketoshi Sekine, Y. Takita, K. Araki
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引用次数: 11
Abstract
In this paper, several methods are outlined for detecting functional changes in an IC due to external interference such as ESD or EMI. The goal is to provide diagnostic tools for detection of potential soft failure susceptibilities of complex systems during the hardware design stage without the aid of any complex software.
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