K. Hakuta, T. Nakanishi, M. Uesaka, K. Miya, K. Aoki, A. Takahashi
{"title":"Upgrade of Micro Eddy Current Testing","authors":"K. Hakuta, T. Nakanishi, M. Uesaka, K. Miya, K. Aoki, A. Takahashi","doi":"10.1016/B978-0-444-82139-3.50048-3","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":356308,"journal":{"name":"Elsevier Studies in Applied Electromagnetics in Materials","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Elsevier Studies in Applied Electromagnetics in Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/B978-0-444-82139-3.50048-3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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