{"title":"Current status and developing trends of Cu-Cr contact materials for VCB","authors":"B. Miao, Yan Zhang, Guoxun Liu","doi":"10.1109/DEIV.2004.1422608","DOIUrl":null,"url":null,"abstract":"This paper briefly reviews the Cu-Cr materials which are widely adopted for contacts in medium-voltage, high current vacuum circuit breakers (VCB). It is shown that microstructure is a strategic link between the processing and properties of the contact materials, and why the quality and performance of Cn-Cr alloy contact materials are superior to that of CuCr p/m contact materials.","PeriodicalId":137370,"journal":{"name":"XXIst International Symposium on Discharges and Electrical Insulation in Vacuum, 2004. Proceedings. ISDEIV.","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"XXIst International Symposium on Discharges and Electrical Insulation in Vacuum, 2004. Proceedings. ISDEIV.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DEIV.2004.1422608","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 20
Abstract
This paper briefly reviews the Cu-Cr materials which are widely adopted for contacts in medium-voltage, high current vacuum circuit breakers (VCB). It is shown that microstructure is a strategic link between the processing and properties of the contact materials, and why the quality and performance of Cn-Cr alloy contact materials are superior to that of CuCr p/m contact materials.
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