L. Lobanov, A. Nedoseka, S. A. Nedoseka, M. Yaremenko, M. A. Ovsienko
{"title":"Problems of technical diagnostics and approaches to their solution","authors":"L. Lobanov, A. Nedoseka, S. A. Nedoseka, M. Yaremenko, M. A. Ovsienko","doi":"10.37434/tdnk2022.02.01","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":126730,"journal":{"name":"Tehničeskaâ diagnostika i nerazrušaûŝij kontrolʹ","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Tehničeskaâ diagnostika i nerazrušaûŝij kontrolʹ","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.37434/tdnk2022.02.01","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}