Antenna Patterns with Arbitrary Side Lobe Topography

Abstract

A perturbation technique which will modify Taylor-type linear and circular aperture distributions to give sum and difference patterns with arbitrary side lobe topography is described and illustrated by several practical cases. A new technique for discretizing the resulting continuous aperture distributions is presented and shown to be superior to the conventional method of sampling. Experimental support of the theory is referenced for the case of a nineteen element linear slot array. Application to the design of digital filters is indicated.