{"title":"RF modeling of vertical interconnection between power-ground plane combined with 2D TLM","authors":"R. Ito, R. Carrillo-Ramirez, R. Jackson","doi":"10.1109/EPEP.2001.967677","DOIUrl":null,"url":null,"abstract":"In this paper, we present a modeling technique for finding a lumped element model of a via interconnection that can be used in conjunction with a coarse grid two-dimensional transmission line matrix method (2D-TLM) analysis. The technique allows the use of very simple 2D TLM analysis to simultaneously compute insertion loss, return loss, and isolation of multiple via transitions through a power-ground plane pair in a multilayer package. The accuracy of this technique is validated by comparison to HFSS.","PeriodicalId":174339,"journal":{"name":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2001.967677","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
In this paper, we present a modeling technique for finding a lumped element model of a via interconnection that can be used in conjunction with a coarse grid two-dimensional transmission line matrix method (2D-TLM) analysis. The technique allows the use of very simple 2D TLM analysis to simultaneously compute insertion loss, return loss, and isolation of multiple via transitions through a power-ground plane pair in a multilayer package. The accuracy of this technique is validated by comparison to HFSS.