R. Watanabe, K. Uetani, S. Tsuneyasu, Nobuyuki Nakayama, T. Satoh
{"title":"Correlation between EL Characteristics and Substrate Surface Roughness in Top-Emission Powder EL Devices","authors":"R. Watanabe, K. Uetani, S. Tsuneyasu, Nobuyuki Nakayama, T. Satoh","doi":"10.36463/idw.2022.1091","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":379548,"journal":{"name":"Proceedings of the International Display Workshops","volume":"76 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-12-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the International Display Workshops","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.36463/idw.2022.1091","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}