{"title":"Influence of surface charging on secondary-electron yield of MgO film","authors":"Q. Wei, M. Fu, Shengli Wu, Wenbo Hu, Jintao Zhang","doi":"10.1109/IVEC.2015.7224039","DOIUrl":null,"url":null,"abstract":"The influence of surface charging on secondary electron emission yield of the MgO film bombarded at low energy electron has been analyzed from charging kinetics and current density effects. The surface charging affects not only the original incident electron energy but also the efficiency of secondary electron emission. We can expect that these results are helpful for accomplishing a secondary electron yield with a slow decay rate for MgO thin film.","PeriodicalId":435469,"journal":{"name":"2015 IEEE International Vacuum Electronics Conference (IVEC)","volume":"76 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Vacuum Electronics Conference (IVEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVEC.2015.7224039","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The influence of surface charging on secondary electron emission yield of the MgO film bombarded at low energy electron has been analyzed from charging kinetics and current density effects. The surface charging affects not only the original incident electron energy but also the efficiency of secondary electron emission. We can expect that these results are helpful for accomplishing a secondary electron yield with a slow decay rate for MgO thin film.
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