Dry etching and low-temperature direct bonding process of lithium niobate wafer for fabricating micro/nano channel device

T. Tsuchiya, K. Sugano, Hideki Takahashi, H. Seo, Y. Pihosh, Y. Kazoe, K. Mawatari, T. Kitamori, O. Tabata
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引用次数: 5

Abstract

We have developed dry etching process of lithium niobate (LN) wafer using neutral loop discharge reactive ion etching (NLD-RIE) to fabricate both micro- and nano-channels for investigating proton diffusion enhancement in ferroelectric nanochannels. We have also developed low-temperature direct bonding process between LN wafers. Two-hundred parallel nanochannel array of 200-nm deep and wide and 400-μm long connected to two microchannels (width: 500 μm, depth: 5.9 μm) at the both ends were fabricated. We have succeeded in measuring the proton diffusion coefficient as high as 1.2×10−8 m2/s.
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制备微纳通道器件的铌酸锂晶圆干蚀刻及低温直接键合工艺
为了研究铁电纳米通道中质子扩散的增强,我们开发了利用中性环放电反应离子刻蚀(NLD-RIE)制备铌酸锂(LN)晶圆的干刻蚀工艺。我们还开发了LN晶圆之间的低温直接键合工艺。制备了200个深200 nm、宽200 nm、长400 μm的平行纳米通道阵列,并在两端连接两个宽500 μm、深5.9 μm的微通道。我们成功地测量了高达1.2×10−8 m2/s的质子扩散系数。
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