{"title":"Onboard condition monitoring of solder fatigue in IGBT power modules","authors":"B. Ji, V. Pickert, W. Cao, L. Xing","doi":"10.1109/DEMPED.2013.6645690","DOIUrl":null,"url":null,"abstract":"This paper proposes a novel on-board condition monitoring of the aging of solder layers in IGBTs for electric vehicle applications. The diagnostic technique makes use of the chip itself as a temperature sensor while current sensors are already in place for control purposes. An auxiliary power supply unit which can be created from the 12V battery and an in situ data-logger circuit is developed for condition monitoring. The novel aspect of the proposed technique relates to monitoring IGBTs in situ when the electric vehicle is operating during stop-and-go traffic conditions or at routine services. The accelerated aging tests are performed on the test vehicles and the condition monitoring system is validated using simulation and thermo-electrical experimentation. The thermal performance of the thermal resistance/impedance and junction temperature of the IGBTs demonstrates the effectiveness of the proposed technique for IGBT health monitoring.","PeriodicalId":425644,"journal":{"name":"2013 9th IEEE International Symposium on Diagnostics for Electric Machines, Power Electronics and Drives (SDEMPED)","volume":"154 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 9th IEEE International Symposium on Diagnostics for Electric Machines, Power Electronics and Drives (SDEMPED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DEMPED.2013.6645690","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16
Abstract
This paper proposes a novel on-board condition monitoring of the aging of solder layers in IGBTs for electric vehicle applications. The diagnostic technique makes use of the chip itself as a temperature sensor while current sensors are already in place for control purposes. An auxiliary power supply unit which can be created from the 12V battery and an in situ data-logger circuit is developed for condition monitoring. The novel aspect of the proposed technique relates to monitoring IGBTs in situ when the electric vehicle is operating during stop-and-go traffic conditions or at routine services. The accelerated aging tests are performed on the test vehicles and the condition monitoring system is validated using simulation and thermo-electrical experimentation. The thermal performance of the thermal resistance/impedance and junction temperature of the IGBTs demonstrates the effectiveness of the proposed technique for IGBT health monitoring.