Electro-optic study of the bandstructure of lnGaAs laser materia

Abstract

CWF44 Fig. 2 Experimental and calculated reflectances of the same aluminum oxide/ titanium oxide multilayer as that in Fig. 1 as a function of incident angle. monochromatized synchrotron radiation from the heamline 5B of the 750-MeV electron storage ring located at the Ultraviolet Synchrotron Radiation Facility (UVSOR), Institute for Molecular Science, Okazaki, Japan. The calculated reflectances (dashed curve) also show almost the same reflectances around 32% as the experimental ones. The full width of the half maximum of the experimental reflectances at 2.734 nm is 0.0381 nm, corresponding to A M = 0.0139. Figure 2 shows experimental plots and the calculated curve of the dependence of reflectances of the same aluminum oxidekitanium oxide multilayer as that in Fig. 1 on incident angle of the soft-X ray. The experimental plots agree well with the calculation. Full width of the half maximum of the reflectance at 71.8'is about 1.0'. *Department of Electrical Engineering, Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Kanagawa223, Japan 1. T. W. Barhee, Jr., S. Morowka, M. C. Hettrick, Appl. Opt. 24,883 (1985). 2. H. Kumagai, M. Matsumoto, Y. Kawamura, K. Toyoda, M. Obara, Jpn. J. Appl. Phys. 33,7086 (1994). H. Kumagai, K. Toyoda, M. Matsumoto, M. Obara, Jpn. J. Appl. Phys. 32, 6137 (1993). H. Kumagai, K. Toyoda, Appl. Surf. Sci. 82/83,481 (1994). H. Kumagai, M. Matsumoto, K. Toyoda, M. Obara, M. Suzuki, Thin Solid Films 263,47 (1995). 3.