System of methods and programs for the characterization of axial textures by synchrotron light and electrons

Abstract

Crystallographic algorithms and computer programs play significant roles in materials’ characterization. A software package for the quantitative characterization of crystallographic texture, under axial symmetry conditions, is presented. The proposed methodology is intended for use with both electrons and high-energy synchrotron X-rays. Three different programs are introduced. Anaelu and Grazing are based on the Rietveld modelling approach. Dianne follows the Bunge’s symmetrized spherical harmonics method. A SrTiO3 model sample is proposed as a hypothetical study case.