Modeling of temperature effects in a surface-potential based ASM-HEMT model

S. Ghosh, K. Sharma, S. Agnihotri, Y. Chauhan, S. Khandelwal, T. Fjeldly, F. M. Yigletu, B. Iñíguez
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引用次数: 11

Abstract

Here, we present the modeling of temperature effects in the surface potential based “Advanced Spice Model for High Electron Mobility Transistor” (ASM-HEMT) for AlGaN/GaN HEMTs. We extract the temperature dependencies of mobility, saturation velocity, cut-off voltage and access resistance parameters of this model. This enables accurate modeling of I-V, gm and gds at multiple temperatures. Our model is compared with measured data and shows excellent fitting for a wide range of temperature.
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基于表面电位的ASM-HEMT模型中温度效应的模拟
在这里,我们提出了基于表面电位的“高电子迁移率晶体管高级Spice模型”(ASM-HEMT)对AlGaN/GaN hemt的温度效应的建模。我们提取了该模型的迁移率、饱和速度、截止电压和接入电阻参数的温度依赖关系。这使得在多个温度下精确建模I-V, gm和gds。我们的模型与实测数据进行了比较,结果表明,该模型在很宽的温度范围内具有很好的拟合效果。
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