K. Murano, N. Takata, Misaki Hoshino, Y. Kami, F. Xiao, M. Tayarani
{"title":"Theoretical analysis of BCI test system using circuit concept approach","authors":"K. Murano, N. Takata, Misaki Hoshino, Y. Kami, F. Xiao, M. Tayarani","doi":"10.1109/ISEMC.2016.7571716","DOIUrl":null,"url":null,"abstract":"In a bulk current injection test (BCI test), an electric current is injected into a wire harness connected to an electronic equipment. Since this test setup can be considered as a transmission line exposed to an external electromagnetic field, the relation of the line voltage and current is expressed by a modified telegrapher's equation. This paper reveals an analytical method of the BCI-test system using the circuit concept approach, and its effectiveness is experimentally verif ed. Furthermore, the difference between the susceptibility of transmission line exposed to the plane-EM field and that under the BCI test is shown as an example.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2016.7571716","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
In a bulk current injection test (BCI test), an electric current is injected into a wire harness connected to an electronic equipment. Since this test setup can be considered as a transmission line exposed to an external electromagnetic field, the relation of the line voltage and current is expressed by a modified telegrapher's equation. This paper reveals an analytical method of the BCI-test system using the circuit concept approach, and its effectiveness is experimentally verif ed. Furthermore, the difference between the susceptibility of transmission line exposed to the plane-EM field and that under the BCI test is shown as an example.