S. Cobos-Bandera, J. Sánchez-Martínez, E. Márquez-Segura
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引用次数: 3
Abstract
A MEMS-based reconfigurable test-set for differential and common mode S-parameters measurement, using a two-port network analyzer as a host instrument, is presented. The test-set uses discrete packaged MEMS switches to provide reconfigurable paths for common and differential mode separately. Therefore, this system is suitable for measurements of differential circuits without making multiple connections, avoiding some of the uncertainties derived from the reconnecting of the ports. In addition, the results of a de-embedding technique are presented in order to assess the performance of the test-set.
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